Reflexion type near-field Raman spectrometer instrument head |
Title： |
| Reflexion type near-field Raman spectrometer instrument head |
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Application Number： |
200710119272 |
Application Date： |
2007/07/19 |
Announcement Date： |
2007/12/05 |
Pub. Date： |
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Publication Number： |
101082585 |
Announcement Number： |
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Grant Date： |
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Granted Pub. Date： |
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ApplicationType： |
Invention |
State/Country： |
11[] |
IPC： |
G01N 21/65 |
Applicant(s)： |
Tsinghua University |
Inventor(s)： |
Wang Jia, Xu Jiying, Wu Xiaobin, Wang Rui, Wang Yang, Tian Qian |
Key Words： |
Reflexion type, spectrometer, instrument head, Raman |
Abstract： |
The invention discloses a reflected near-field Lamen spectrometer measuring head based on local field reinforcing elementary of metal nanometer probe in the near-field optical, spectrum analytical detector technical domain, which is characterized by the following: adjusting the incidence angle of the excited light and the collecting angle of near-field Lamen spectrum signal; collecting the near-field Lamen spectrum signal from different directions; realizing multiple measuring patterns; improving the exciting efficiency and collecting efficiency of near-field Lamen spectrum signal effectively as well as the signal-to-noise ratio and detecting sensitivity; obtaining the nanometer size shape image, hyper-diffraction resolution near-field Lamen spectrum and near-field Lamen spectrum image simultaneously. adopting paralleling beam interface to combine with each kind of Lamen spectrometer or commercial Lamen spectrometer; fitting for dielectric size study in the biological, medical, chemical, physical and material domains widely. |
Claim： |
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Priority： |
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PCT： |
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LegalStatus： |
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