Surface plasma wave microscope with phase shift interference
Title：
Surface plasma wave microscope with phase shift interference
Application Number：
 01136669
Application Date：
 2001/10/26
Announcement Date：
 2002/04/03
Pub. Date：
 2004/07/07
Publication Number：
 1342897
Announcement Number：
 1156683
Grant Date：
 2004-7-7
Granted Pub. Date：
 2004-7-7
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01B 9/04, G01N 21/21, G01N 21/27, G01N 21/41
Applicant(s)：
 Qinghua Unimv
Inventor(s)：
 Guo Jihua, Guo Jun, Wang Dongsheng
Key Words：
 Surface plasma wave, microscope, phase shift interference
Abstract：
 A surface plasma microscope with phase shift interference is composed of laser device, light beam diffuser, polarizer, sensor, lens, CCD imaging system, computer, 1/4 wave plate and analyzer. The laser beam goes through light beam diffuser and polarizer to become parallel beams containing P and S waves. Withreflected by a reflecting serface of the sensor, the beams are imaged on CCD imaging system by the lens. Said 1/4 wave plate and analyzer constitute a phase compensator for the phase compensation. The images containing the information about amplitude and phase are finally processed and displayed by computer. Its advantage is the combination technique of phase shift interferenace with surface plasma wave.
Claim：
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PCT：
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