Multifunction tridimension displacement laser interference measuring system
Title：
Multifunction tridimension displacement laser interference measuring system
Application Number：
 200410000005
Application Date：
 2004/01/02
Announcement Date：
 2004/12/22
Pub. Date：
 2007/03/14
Publication Number：
 1556371
Announcement Number：
 1304817
Grant Date：
 2007-3-14
Granted Pub. Date：
 2007-3-14
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01B 11/16
Applicant(s)：
 Tsinghua Univ.
Inventor(s)：
 Dai Fulong, Xie Huimin, Fang Daining
Key Words：
 Multifunction, tridimension displacement, laser interference, measuring system
Abstract：
 The measuring system is composed of laser, image collection camera system, spectrum coupler, 3D interference optical system, and 6D adjustable loading frame. The measuring system provides functions of real time measurement in u, v, w three displacement fields with high accuracy in sensitivity of wavelength magnitude, possessing two measuring modes: gradation interference and electronic speckle interference. Adjustment in six degrees of freedom is realized by 6D adjustable loading frame so as to implement loading experiments of one-way pulling and pressing, and bending at three points providing features of easy of use, compact structure and high precision. Moreover, there is phase shift system. Measuring precision reaches to nano magnitude when phase shift technique is applied.
Claim：
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PCT：
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2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
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