Scan based self-testing structure and method adopting weighted scanning strobe signal
Title：
Scan based self-testing structure and method adopting weighted scanning strobe signal
Application Number：
 200510011382
Application Date：
 2005/03/04
Announcement Date：
 2005/08/17
Pub. Date：
Publication Number：
 1654973
Announcement Number：
Grant Date：
Granted Pub. Date：
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01R 31/3185, G01R 31/317
Applicant(s)：
 Tsinghua University
Inventor(s)：
 Xiang Dong, Sun Jiaguang, Chen Mingjing
Key Words：
 weighted scanning, strobe signal, scan, self-testing, structure, method
Abstract：
 A self-test structure based on scan applying weight scan gating signals characterizes that the special weighted random signal generates a weighted random signal of logic output as the scanning gating signal of scanning chains in the scanning circuit, different scanning chains can correspond to different weighted values. Therefore, this invention also puts forward a method for selecting weighted values corresponding to the scanning chains separately in one weight set. This invented structure can realize the collection of test responses at any period.
Claim：
Priority：
PCT：
LegalStatus：

Recommend this patent:
1 2 3 4 5
Average ( 0 votes):
                                                                          Recommended Patents>>

Relevancy information

2D scan tree structure for measurable scan design of low-power integrated circuits
Fully-sealed high vacuum electron beam accelerating and scanning integrated structure


Other Patents of Same Inventor

Method for reducing expense of pin of non-scanning measurabl design
Scanning design with nano-scanning design test cost and test vector input method
Closed-loop feedback automatic feeding device controlled by single-chip
Method for constructing two-stage sweep test structure with low test power dissipation
Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection
Method and equipment for disassembling components entirely from waste circuit board
Method and equipment for disassembling circuit board using non-contacted impact
Method and equipment for disassembling circuit board using contacted impact



News & Events More>>

Last Update  
2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
2008-3-31
  Selected patents owned by Tsinghua University filed in 2006 and 2007 are load.







Copyright 2008-2015 All Rights Reserved Patent License of China.      Designed by Easygo