Tumble angle measuring method and measurer  | 
                     
                    
                      Title:  | 
                      
                        
                          
                            | Tumble angle measuring method and measurer  | 
                           
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                      Application Number:  | 
                      01130893  | 
                      Application Date:  | 
                      2001/08/31  | 
                     
                    
                      Announcement Date:  | 
                      2002/02/13   | 
                      Pub. Date:  | 
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                      Publication Number:  | 
                      1335483  | 
                      Announcement Number:  | 
                      1166918 | 
                     
                    
                      Grant Date:  | 
                      2004-9-15  | 
                      Granted Pub. Date:  | 
                      2004-9-15 | 
                     
                    
                      ApplicationType:  | 
                      Invention   | 
                      State/Country:  | 
                      11[China|beijing] | 
                     
                    
                      IPC:  | 
                      G01B 11/26  | 
                     
                    
                      Applicant(s):  | 
                      Qinghua Univ.  | 
                     
                    
                      Inventor(s):  | 
                      Yin Chunyong, Liu Zhongyao, Lin Dejiao  | 
                     
                    
                      Key Words:  | 
                      Tumble angle, measuring method, measurer  | 
                     
                    
                      Abstract:  | 
                      The present invention belongs to the field of optical angle measuring technology, and includes setting half-reflecting mirror in the output light axis of Zeeman laser, setting half wave plate perpendicularly in the transmission light path of the half-reflecting mirror, and setting half wave plate, analyzer, one first photoelectronic detector successively and perpendicular second photoelectronic detector in the reflection light path; and one phase meter with input connected to the output of the first and the second photoelectronic detectors and output to the computer. The present invention has strengthened non-linearity and 4 times raised sensitivity, and the close measuring detectors and light source results in compact structure and ever high practicability.  | 
                     
                    
                      Claim:  | 
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                      Priority:  | 
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                      PCT:  | 
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                                Last Update  | 
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                                 2008-4-17 | 
                               
                              
                                |   | 
                                Selected patents owned by Tsinghua University filed in 2005 are loaded. | 
                               
                              
                                  | 
                                 2008-3-31  | 
                               
                              
                                |   | 
                                Selected patents owned by Tsinghua University filed in 2006 and 2007 are load. | 
                               
                             
                            
                            
                            
                            
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