Wavelength calibration method of optical spectrum instruments
Title：
Wavelength calibration method of optical spectrum instruments
Application Number：
 200710177242
Application Date：
 2007/11/13
Announcement Date：
 2008/04/09
Pub. Date：
Publication Number：
 101158599
Announcement Number：
Grant Date：
Granted Pub. Date：
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01J 3/12, G01J 3/18, G01J 3/28, G01J 3/10
Applicant(s)：
 Tsinghua University
Inventor(s)：
 Yang Huaidong, Huang Xingyue, He Qingsheng
Key Words：
 Wavelength calibration method, optical spectrum instruments
Abstract：
 A wavelength calibration method of spectral instrumentation mainly relating to wave length calibration method adopting spectral instrumentation of array detector pertains to the filed of wave length calibration technology of spectral instrumentation. The spectral instrumentation of the method adopts array detectors and lighting source of linear spectra, spatial locations of every spectrum peak of the lighting source are acquired from the spectrogram output from the instrumentation, and the 'spatial location - wave-length relationship' on the power spectrum is fitted by according these spectrum peak wavelength and the corresponding spatial locations thereof, thus corresponding wavelength of every pixel of the detector is confirmed, the spatial locations of every spectrum peak of the lighting source is acquired through processes as following: sub-pixel detecting; sub-pixel reestablishing; spectrum peak spatial locations acquiring. The sub-pixel detecting of the invention increases sampling ratio of spectrogram, spectrogram with improved resolution in acquired; the comprehensive applications of sub-pixel detecting, sub-pixel reestablishing and spectrum contour fitting further increases the wavelength accuracy of spectral instrumentation with array detectors step by step. The invention has prominent effect.
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