High precision method and device for measuring wave plate phase delay |
Title： |
| High precision method and device for measuring wave plate phase delay |
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Application Number： |
200310117382 |
Application Date： |
2003/12/12 |
Announcement Date： |
2004/11/17 |
Pub. Date： |
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Publication Number： |
1546989 |
Announcement Number： |
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Grant Date： |
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Granted Pub. Date： |
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ApplicationType： |
Invention |
State/Country： |
11[China|beijing] |
IPC： |
G01N 21/27 |
Applicant(s)： |
Tsinghua University |
Inventor(s)： |
Zhang Shulian, Zong Xiaobin, Zhang Yi |
Key Words： |
High precision, wave plate, phase delay, measuring method, measuring device |
Abstract： |
The invention is a method and device for measuring wave plate phase delay with high precision which belongs to laser measurement technology field, the character lies in: it uses semi inner cavity helium-neon laser, the laser is made up of a gain tube and an independent reflecting mirror. The two ends of the gain tube fixes a reflecting mirror and a transparent window piece, the independent reflecting mirror is driven by piezoelectric ceramic. The measured wave plate is inserted in the laser resonance cavity, the laser output mode generate beat frequency through a polarized piece, which is received by the detector, it is transmitted to the spectrum device or the frequency meter to be displayed after processed by circuit, works out the phase delay according the display. It also adds the transverse magnetic field formed by two groups of magnet at the gain tube axial direction, or uses a wave plate or a set of forcing device to measure the phase delay of semi or whole wave plate. It sets five examples of measuring devices. |
Claim： |
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Priority： |
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PCT： |
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LegalStatus： |
2007-3-21Date of deemed withdrawal |
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