Full-fiedl correction method for laser scanning cofocal microscope scanning distortion phenomenon
Title：
Full-fiedl correction method for laser scanning cofocal microscope scanning distortion phenomenon
Application Number：
 200610012007
Application Date：
 2006/05/26
Announcement Date：
 2006/10/25
Pub. Date：
 2007/12/19
Publication Number：
 1851522
Announcement Number：
 100356228
Grant Date：
 2007-12-19
Granted Pub. Date：
 2007-12-19
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G02B 21/00
Applicant(s)：
 Tsinghua Univ.
Inventor(s)：
 Xie Huimin, Hua Tao, Fang Daining, Pan Bing
Key Words：
 laser scanning, cofocal microscope, distortion phenomenon, full-fiedl correction
Abstract：
 The present invention adopts standard raster specimen, using LSCM scanning moire method to obtain scanning moire image, to proceed four steps phase shift processing to originality image though moire phase shift technology to obtain phase shift moire image, according to moire phase shift theory to obtain phase map, after unpackaging to obtain originality phase map, according to phase and displacement field relation to obtain scanning perturbed field, thereby reaching correction target. Compared with current method, the present invention can directly measure scan line perturbed field resulted from scanning control unit distortion phenomena through scanning moire and moire phase shift technology , with high precision, simple operation, and real time and all field measurement.
Claim：
Priority：
PCT：
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