Method for reducing expense of pin of non-scanning measurabl design
Title：
Method for reducing expense of pin of non-scanning measurabl design
Application Number：
 02146776
Application Date：
 2002/11/08
Announcement Date：
 2003/03/26
Pub. Date：
Publication Number：
 1405879
Announcement Number：
 1182577
Grant Date：
 2004-12-29
Granted Pub. Date：
 2004-12-29
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01R 31/26, G01R 31/28, H01L 21/82
Applicant(s)：
 Tsinghua Daxue
Inventor(s)：
 Xiang Dong
Key Words：
 reducing method, expense, pin, non-scanning measurabl design
Abstract：
 The characters of the invention are as follows. The structure of the test points, which is at low cost and measurably by the non scanning method, designed by own is adopted. The invention reduces the input ends of the control signal as much as possible so as to reduce the spending of the pins. Also, the invention connects the control signal to the original input that will not cause the new immesurable fault as much as possible in order to avoid the conflict between the signal targets. Whether the fan-outs of the new re-concourse are the branches with different time delay is determined. If it is different, the immersurable fault with not occur. If it is same, whether the fan-outs of the new re-concourse possess the consistent inverted parity is determined. If the parity is 00, the new immesurable fault will not occur.
Claim：
Priority：
PCT：
LegalStatus：

Recommend this patent:
1 2 3 4 5
Average ( 0 votes):
                                                                          Recommended Patents>>

Relevancy information



Other Patents of Same Inventor

Scanning design with nano-scanning design test cost and test vector input method
Closed-loop feedback automatic feeding device controlled by single-chip
Method for constructing two-stage sweep test structure with low test power dissipation
Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection
Scan based self-testing structure and method adopting weighted scanning strobe signal
Method and equipment for disassembling components entirely from waste circuit board
Method and equipment for disassembling circuit board using non-contacted impact
Method and equipment for disassembling circuit board using contacted impact



News & Events More>>

Last Update  
2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
2008-3-31
  Selected patents owned by Tsinghua University filed in 2006 and 2007 are load.







Copyright 2008-2015 All Rights Reserved Patent License of China.      Designed by Easygo