Scanning design with nano-scanning design test cost and test vector input method
Title：
Scanning design with nano-scanning design test cost and test vector input method
Application Number：
 02159931
Application Date：
 2002/12/30
Announcement Date：
 2004/07/14
Pub. Date：
 2006/08/02
Publication Number：
 1512560
Announcement Number：
 1267739
Grant Date：
 2006-8-2
Granted Pub. Date：
 2006-8-2
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01R 31/28, H01L 21/00
Applicant(s)：
 Tsinghua Univ.
Inventor(s)：
 Xiang Dong, Sun Jiaguang, Chen Mingjing
Key Words：
 Scanning design, nano-scanning design, test cost, test vector input method
Abstract：
 A scan design and a test vector setting method characterizes in a 'scan forest' style, taking the original input end as the root node of each scanning tree for inputting test vectors in test then to connect a set of triggers in the principle that any successor unit in two triggers is not the same at each original input end then to select one of them as the next layer root node, to connect another set of triggers of the next layer in light of the said principle forest to form a scan forest and apply the structure in a scan design, having very high fault coverage and test efficiency reducing test time, area cost and power loss.
Claim：
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PCT：
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2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
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