Method for constructing two-stage sweep test structure with low test power dissipation |
Title： |
| Method for constructing two-stage sweep test structure with low test power dissipation |
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Application Number： |
200410088881 |
Application Date： |
2004/11/08 |
Announcement Date： |
2005/04/06 |
Pub. Date： |
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Publication Number： |
1603853 |
Announcement Number： |
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Grant Date： |
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Granted Pub. Date： |
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ApplicationType： |
Invention |
State/Country： |
11[China|beijing] |
IPC： |
G01R 31/28, G01R 31/317, G01R 31/3185, G06F 11/22 |
Applicant(s)： |
Tsinghua University |
Inventor(s)： |
Xiang Dong, Sun Jiaguang, Li Kaiwei |
Key Words： |
constructing method, two-stage, sweep test structure, low test power dissipation |
Abstract： |
It is a method to form a two-step scanner structure with low power consumption and belongs to integration circuit measurement technique field. The method is characterized by the following: first to get a form judging whether there is common composition relay between any two time sequences from circuit net single file; to classify the units into groups according to the form; to alter all the time sequence units into scanning time sequence unit; to select one scanning sequence unit from each group to form a scanning chain connected to the time signal clk#-[1] and the rest scanning time sequence units is classified into small groups connected to the time signal clk#-[2] . |
Claim： |
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Priority： |
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PCT： |
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LegalStatus： |
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