Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection
Title：
Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection
Application Number：
 200410009678
Application Date：
 2004/10/15
Announcement Date：
 2005/03/30
Pub. Date：
 2007/11/14
Publication Number：
 1601293
Announcement Number：
 100348993
Grant Date：
 2007-11-14
Granted Pub. Date：
 2007-11-14
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01R 31/318, G01R 31/317
Applicant(s)：
 Tsinghua Univ
Inventor(s)：
 Xiang Dong, Sun Jiaguang, Li Kaiwei
Key Words：
 scanning chain, scanning forest, construction, non-fault shielding, odd-couple detection
Abstract：
 The method for constructing scanning chain or scanning forest of fault-free screening odd-even test belongs to the field of integrated circuit testabbility design technology. It is characterized by that said method includes the following steps: firstly, utilizing circuit network monofile to analyze interrelationship of sequence units on the circuit structure in the circuit to obtain the discrimination table for discriminating that between pairwise sequence units the common combinatiorial predescessor and common combinatiorial successor are existed or not; utilizing the condition of having not common combinatiorial predecessor between pairwise sequence units to construct scanning chain of fault-free screening odd-oven test; utilizing the condition of having not common combinatiorial predecessor and having not common combinatiorial successor between pairwise sequence units to construct scanning forest of fault-free screening odd-even test. Said invention utilizes the method of adding multichannel selector before sequence unit to change it into scanning sequence unit, and adopts exclusive-OR tree to make odd-even test.
Claim：
Priority：
PCT：
LegalStatus：

Recommend this patent:
1 2 3 4 5
Average ( 0 votes):
                                                                          Recommended Patents>>

Relevancy information



Other Patents of Same Inventor

Method for reducing expense of pin of non-scanning measurabl design
Scanning design with nano-scanning design test cost and test vector input method
Closed-loop feedback automatic feeding device controlled by single-chip
Method for constructing two-stage sweep test structure with low test power dissipation
Scan based self-testing structure and method adopting weighted scanning strobe signal
Method and equipment for disassembling components entirely from waste circuit board
Method and equipment for disassembling circuit board using non-contacted impact
Method and equipment for disassembling circuit board using contacted impact



News & Events More>>

Last Update  
2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
2008-3-31
  Selected patents owned by Tsinghua University filed in 2006 and 2007 are load.







Copyright 2008-2015 All Rights Reserved Patent License of China.      Designed by Easygo