Transient current measuring method and system for IC chip
Title：
Transient current measuring method and system for IC chip
Application Number：
 200510011112
Application Date：
 2005/01/07
Announcement Date：
 2005/08/17
Pub. Date：
 2007/11/07
Publication Number：
 1654966
Announcement Number：
 100347552
Grant Date：
 2007-11-7
Granted Pub. Date：
 2007-11-7
ApplicationType：
 Invention
State/Country：
 11[China|beijing]
IPC：
 G01R 19/25, G01R 31/28
Applicant(s)：
 Tsinghua University
Inventor(s)：
 Sun Yihe, Li Xiangyu
Key Words：
 IC chip, transient current, measure, method, system
Abstract：
 This invention relates to a transient current test method for chip and its system characterizing in including generating excited graphs based on an excitation restraint grouping the excited graphs and setting up group index, extracting transient waveforms, processing data of the collected transient current and forming data documents and carrying out experimental analysis to the data documents in terms of the needs. This invention expands the function of ordinary IC test devices and sets up a complete flow from the generation of excited graphs to the test and process of data.
Claim：
Priority：
PCT：
LegalStatus：

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2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
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  Selected patents owned by Tsinghua University filed in 2006 and 2007 are load.







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