Parallel column scanning spectrum type surface plasma resonant imaging method and apparatus
Title:
Parallel column scanning spectrum type surface plasma resonant imaging method and apparatus
Application Number:
200510036232
Application Date:
2005/08/03
Announcement Date:
2006/03/01
Pub. Date:
Publication Number:
1740778
Announcement Number:
Grant Date:
Granted Pub. Date:
ApplicationType:
Invention
State/Country:
94[China|shenzhen]
IPC:
G01N 21/41, G01N 21/84, G06K 9/00, G06F 19/00
Applicant(s):
Shenzhen Graduate School, Tsinghua Univ.
Inventor(s):
Liu Le, He Yonghong, Guo Jihua, Ma Hui
Key Words:
Parallel column scanning, spectrum type, surface plasma, resonant imaging, method, apparatus
Abstract:
Its method includes the following steps: changing the beam emitted by broadband light source into a hairline beam; making said hairline beam be irradiated on SPR generation device; after the beam outcome from said device is dispersed, utilizing two-dimensional photoelectric detection device to make detection and obtain SPR spectrum information in a lighted line-type region of tested plane; translating said device and using said hairline beam to scan the whole tested plane to obtain SPR spectrum information of all the columns of whole tested plane; utilizing computer to make operation and processing to obtain refractive index information of whole tested plane in said device so as to form a two-dimensional image. Said method can be used for detecting various biological chips.
Claim:
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PCT:
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2008-4-17
  Selected patents owned by Tsinghua University filed in 2005 are loaded.
2008-3-31
  Selected patents owned by Tsinghua University filed in 2006 and 2007 are load.







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